Risk Occurrence Assessment of the Background Conformity Conditions of Inspection and Quarantine Based on FMEA
- Yunhui Dai
- Yue Xue
- Zhijun Han
- Wei Zhang
Abstract
In order to promote the scientific and normalized work of the inspection and quarantine, limited inspection and quarantine resources have to be used for efficient management of limitless inspection and quarantine objects, which requires the screening of the background conformity conditions of inspection and quarantine. Failure Modes and Effects Analysis (FMEA) is a methodology for potential reliability analysis and safety assessment, and has been widely applied to the protection system of accident prevention. It is of great significance to use FMEA to assess risk in the field of inspection and quarantine. This paper provides an approach for risk occurrence assessment according to actual needs of inspection and quarantine work, based on risk elements analysis in inspection and quarantine work.- Full Text: PDF
- DOI:10.5539/ijbm.v3n10p37
This work is licensed under a Creative Commons Attribution 4.0 License.
Journal Metrics
Google-based Impact Factor (2023): 0.86
h-index(2023): 152
i10-index(2023): 1168
Index
- Academic Journals Database
- ACNP
- AIDEA list (Italian Academy of Business Administration)
- ANVUR (Italian National Agency for the Evaluation of Universities and Research Institutes)
- Berkeley Library
- CNKI Scholar
- COPAC
- EBSCOhost
- Electronic Journals Library
- Elektronische Zeitschriftenbibliothek (EZB)
- EuroPub Database
- Excellence in Research for Australia (ERA)
- Genamics JournalSeek
- GETIT@YALE (Yale University Library)
- IBZ Online
- JournalTOCs
- Library and Archives Canada
- LOCKSS
- MIAR
- National Library of Australia
- Norwegian Centre for Research Data (NSD)
- PKP Open Archives Harvester
- Publons
- Qualis/CAPES
- RePEc
- ROAD
- Scilit
- SHERPA/RoMEO
- Standard Periodical Directory
- Universe Digital Library
- UoS Library
- WorldCat
- ZBW-German National Library of Economics
Contact
- Stephen LeeEditorial Assistant
- ijbm@ccsenet.org