Abstract

This paper presents a new method of detecting Analog to Digital Converter harmonic distortion. The new method is based on Wavelet multi-resolution process to identify instantaneous harmonic components. In classical testing, Fourier transform algorithm was long adopted to estimate Total Harmonic Distortion by obtaining signal power spectrum. While the conventional method of Fourier transform tend to be complicated and lengthy, the new investigated algorithms of Wavelet transform has shown less computations process and instantaneous testing of ADCs harmonic distortions. By shorten testing times and reduced computation complexity, Wavelet transform can be particularly appropriate for developing ADCs low-cost, and fast testing procedure.

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