The Method of Spherical Surface Roughness Measurement
- Xiaohui Xu
- Yan Cui
Abstract
The spherical surface is measured by means of Atomic Force Microscope (AFM) on nanometer scale. In order to evaluate the surface quality of this kind of three dimensional measurement, the following parameters are suggested: Ra,Rq,Ry and Tp. Some questions related to this choice are discussed in this paper.
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- DOI:10.5539/mas.v3n12p94
This work is licensed under a Creative Commons Attribution 4.0 License.
- ISSN(Print): 1913-1844
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