Automatic Crack Detection in Eggshell Based on SUSAN Edge Detector Using Fuzzy Thresholding
- Meysam Siyah Mansoory
- Meghdad Ashtiyani
- Hossein Sarabadani
Abstract
Among the defect found in the eggs, cracks are the most important in processing and grading table eggs. Eggshell cracks are a food safety concern because micro organism's can contamination of the egg causes pathogens, such as salmonella. Currently, In order to check and eliminate the cracked eggs quickly and exactly in production the process of egg, a non destructive testing system based on Digital Image Processing (DIP) with an efficient algorithm was developed. These algorithms are based on Fuzzy thresholding and SUSAN edge detector. The main advantage of this the method in comparison with other methods is less sensitive to noise, because no derivative operator was used. According to the experimental results, this algorithm had best binerization on the main image in comparison with algorithm Otsu and power law, also the results showed that with add Gaussian noise to the main input image with variable variance between 0.002 and 0.01; the accuracy of detection for proposed algorithm was 97% and 82%, also this algorithm had least value of error function (number of error pixel) on the gray level image toward other algorithms.
- Full Text: PDF
- DOI:10.5539/mas.v5n6p117
Journal Metrics
(The data was calculated based on Google Scholar Citations)
h5-index (July 2022): N/A
h5-median(July 2022): N/A
Index
- Aerospace Database
- American International Standards Institute (AISI)
- BASE (Bielefeld Academic Search Engine)
- CAB Abstracts
- CiteFactor
- CNKI Scholar
- Elektronische Zeitschriftenbibliothek (EZB)
- Excellence in Research for Australia (ERA)
- JournalGuide
- JournalSeek
- LOCKSS
- MIAR
- NewJour
- Norwegian Centre for Research Data (NSD)
- Open J-Gate
- Polska Bibliografia Naukowa
- ResearchGate
- SHERPA/RoMEO
- Standard Periodical Directory
- Ulrich's
- Universe Digital Library
- WorldCat
- ZbMATH
Contact
- Sunny LeeEditorial Assistant
- mas@ccsenet.org