Application of Wavelet Transform Analysis to ADCs Harmonics Distortion

Emad A. Awada, Mohammad H. Alomari

Abstract


This paper presents a new method of detecting Analog to Digital Converter harmonic distortion. The new method is based on Wavelet multi-resolution process to identify instantaneous harmonic components. In classical testing, Fourier transform algorithm was long adopted to estimate Total Harmonic Distortion by obtaining signal power spectrum. While the conventional method of Fourier transform tend to be complicated and lengthy, the new investigated algorithms of Wavelet transform has shown less computations process and instantaneous testing of ADCs harmonic distortions. By shorten testing times and reduced computation complexity, Wavelet transform can be particularly appropriate for developing ADCs low-cost, and fast testing procedure.

Full Text: PDF DOI: 10.5539/cis.v6n3p118

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This work is licensed under a Creative Commons Attribution 3.0 License.

Computer and Information Science   ISSN 1913-8989 (Print)   ISSN 1913-8997 (Online)
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